刀具磨损监测的随机向量相关度量法

本文提出了一种运用功率累积和与n 维随机向量相关度量监测刀具磨损的新方法,即通过计算刀具三向振动加速度的相关度量系数,主轴扭矩或某项振动加速度的功率累积和综合监测刀具的磨损、破损以及刀具磨损的程度。该法在简单性、可靠性等方面比以往提出的方法有较大的进步,因而使得本方法具有很大的应用前景。文中对该法的理论基础进行了严格的证明,并给出了实验论证结果。     

多自由度系统及结构非线性自由振动的摄动谐波平衡法

本文在谐波平衡法的基础上,引入摄动的思想,得出了解多自由度系统及结构的非线性自由振动的新方法。其解的形式为小参数和谐波的级数形式,因此,其解不会遗漏任何项,方程为线性的代数方程;利用线性变换,将系数矩阵变换为对角阵,一旦求出线性模态,就可得其解,比线性化迭代法优越得多。算例表明,本文方法对于小振幅有较高的精度,对于较大振幅其结果也是令人满意的。     

最小费用树

本文在赋边权w和顶点权θ的网络中,建立了最小费用树问题的网络模型。文中对问题的复杂性进行了讨论并给出了求解问题的算法     

随机环境中的M/MY/1排队系统

文献［４］讨论了随机环境中的Ｍ／Ｍ／１排队模型，本文提出和讨论随机环境中的Ｍ／Ｍｙ／１排队模型，在统计平衡条件下给出了队长和等待队长的平稳分布以及平均队长和平均等待队长，得到了等待时间和逗留时间分布以及平均等待时间和平均逗留时间。     

浅析以法律形式控制网络军备竞赛的必要性

网络战是近年来全球军事界相当热的话题,其作为一种全新概念的组织机构,已经开始登上了军事舞台。美国、韩国等国家先后宣布组建网络司令部,引起了全球网络军备竞赛的热潮。文章探讨网络军备竞赛的发展现状和特点,分析以法律形式进行控制的必要性,能够全面系统的了解网络军备竞赛所带来的严重危害,为控制军备竞赛的对策和决策提供一些建议。     

微分方程的有界性与概周期解的存在性

本文考虑高维非自治概周期系统ｄｘｄｔ＝ｆ（ｔ,ｘ）,利用对ｘ的分量分组构造Ｌｉａｐｕｎｏｖ函数的方法讨论了其概周期解的存在性。所得结果去掉了文献中系统存在有界解的假设,得到了比较明显的改进。     

太阳电池阵组合基板模态参数分析的半解析模型

基于分布参数系统传递函数方法的基本理论,针对空间结构太阳电池阵的特殊结构形式,通过将太阳电池阵基板划分为条形单元,将基板间连接铰链副简化为均匀梁单元,并利用条形单元与梁单元公共结点间位移连续与力平衡条件,建立了空间结构太阳电池阵动力学特性分析的半解析计算模型。得到了太阳电池阵单块基板和多块组合基板的模态参数计算值,并将其计算结果与有限元结果进行了比较。     

自由漂浮柔性机械臂系统的动力学建模与仿真

动量矩守恒约束使自由漂浮柔性机械臂系统成为非完整系统,其动力学模型通常是难以求解的微分—代数方程,因此提出将机械臂系统等效为一个完整系统进行建模。假设载体存在姿态控制力矩,此时由于不存在动量矩守恒约束,系统变成一个完整系统,采用Lagrange方法建立其动力学方程;令方程中载体的姿态控制力矩为零,即得到自由漂浮机械臂系统的动力学方程;采用数值方法求解动力学方程,并将动力学分析的结果与ADAMS中仿真的结果进行对比,验证了模型能够有效模拟自由漂浮柔性机械臂系统的动力学特性。     

Determination of burn‐in parameters and residual life for highly reliable products

Today, many products are designed and manufactured to function for a long period of time before they fail. Determining product reliability is a great challenge to manufacturers of highly reliable products with only a relatively short period of time available for internal life testing. In particular, it may be difficult to determine optimal burn‐in parameters and characterize the residual life distribution. A promising alternative is to use data on a quality characteristic (QC) whose degradation over time can be related to product failure. Typically, product failure corresponds to the first passage time of the degradation path beyond a critical value. If degradation paths can be modeled properly, one can predict failure time and determine the life distribution without actually observing failures. In this paper, we first use a Wiener process to describe the continuous degradation path of the quality characteristic of the product. A Wiener process allows nonconstant variance and nonzero correlation among data collected at different time points. We propose a decision rule for classifying a unit as normal or weak, and give an economic model for determining the optimal termination time and other parameters of a burn‐in test. Next, we propose a method for assessing the product's lifetime distribution of the passed units. The proposed methodologies are all based only on the product's initial observed degradation data. Finally, an example of an electronic product, namely contact image scanner (CIS), is used to illustrate the proposed procedure. © 2002 Wiley Periodicals, Inc. Naval Research Logistics, 2003     

Estimating failure time distribution and its parameters based on intermediate data from a Wiener degradation model

Instead of measuring a Wiener degradation or performance process at predetermined time points to track degradation or performance of a product for estimating its lifetime, we propose to obtain the first‐passage times of the process over certain nonfailure thresholds. Based on only these intermediate data, we obtain the uniformly minimum variance unbiased estimator and uniformly most accurate confidence interval for the mean lifetime. For estimating the lifetime distribution function, we propose a modified maximum likelihood estimator and a new estimator and prove that, by increasing the sample size of the intermediate data, these estimators and the above‐mentioned estimator of the mean lifetime can achieve the same levels of accuracy as the estimators assuming one has failure times. Thus, our method of using only intermediate data is useful for highly reliable products when their failure times are difficult to obtain. Furthermore, we show that the proposed new estimator of the lifetime distribution function is more accurate than the standard and modified maximum likelihood estimators. We also obtain approximate confidence intervals for the lifetime distribution function and its percentiles. Finally, we use light‐emitting diodes as an example to illustrate our method and demonstrate how to validate the Wiener assumption during the testing. © 2008 Wiley Periodicals, Inc. Naval Research Logistics, 2008